First invented in 1985 by IBM in Zurich, Atomic Force Microscopy (AFM) is a scanning probe technique for imaging. It involves a nanoscopic tip attached to a microscopic, flexible cantilever, which is ...

Invented 30 years ago, the atomic force microscope has been a major driver of nanotechnology, ranging from atomic-scale imaging to its latest applications in manipulating individual molecules, ...

Neurological disorders are becoming an increasingly significant societal burden, highlighting the critical need for improved diagnostic and therapeutic approaches. Atomic force microscopy (AFM), known ...

The Semilab AFM-1000 is a state-of-the-art tabletop atomic force microscope designed to deliver high-resolution, sub-atomic, precise measurements with an extremely low noise level. It enables highly ...

Today we're looking at Atomic Force Microscopy! I built a "macro-AFM" to demonstrate the principles of an atomic force ...

Atomic force microscopy (AFM) is a way to investigate the surface features of some materials. It works by “feeling” or “touching” the surface with an extremely small probe. This provides a ...

In a study recently published in the journal Nano Letters, researchers from Nano Life Science Institute (WPI-NanoLSI), Kanazawa University, Kanazawa, Japan, used frequency-modulated atomic force ...

High-speed atomic force microscopy (HS-AFM) is the only experimental technique to directly watch proteins in dynamic action. However, as a surface scanning technique with limited spatial resolution, ...

Knowing interaction forces between nanostructures and their substrates is important in nanomanufacturing, such as template-directed assembly. A new mechanical membrane-based AFM (atomic force ...

Electrochemical atomic force microscopy (EC-AFM) is a powerful analytical technique that combines the high-resolution imaging capabilities of atomic force microscopy (AFM) with electrochemical ...