Microprocessor testing and self-test techniques constitute a critical domain in ensuring the reliability and performance of modern computing devices. These methodologies encompass both hardware and ...

Back when semiconductor devices contained only a few thousand gates, manufacturing test was almost an afterthought. The development team threw the chip “over the wall” to the test engineers, who ...

Today’s highly complex and large system on chip (SoC) devices and systems present many challenges to be addressed from manufacturing tests to the field while meeting stringent requirements for test ...