Design-for-test, or DFT, should facilitate high-quality test, not change the design. Test techniques and strategies need to supply a high-quality test that screens out defective devices, avoiding ...

Why isolated flows negatively impact design schedule and PPA. Benefits of unified DFT, synthesis, and physical design flows. Physical implementation optimization methods for test compression and scan ...

Test cost is becoming a major issue in chip design. That should surprise no reader of ISD. What might be surprising is the severity of the problem. Not only are test costs threatening to become the ...

In the IC design flow, design-for-test is often an afterthought. First, the design is coded, then simulated, then synthesized, and only after all that – usually months into the design cycle – it's ...

The dramatic rise in manufacturing test time for today’s large and complex SoCs is rooted in the use of traditional approaches to moving scan test data from chip-level pins to core-level scan channels ...

Back when semiconductor devices contained only a few thousand gates, manufacturing test was almost an afterthought. The development team threw the chip “over the wall” to the test engineers, who ...