TOKYO, Feb. 12, 2025 (GLOBE NEWSWIRE) -- Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857) today announced the T5801 Ultra-High-Speed DRAM Test System. The cutting-edge ...

Increased integration with nanometer processes is resulting in some devices that are using hundreds of small memory blocks distributed throughout the design. Memory BIST can be used to apply standard ...

STAr Technologies, a leading supplier of semiconductor test probe cards, unveils a new one-touch Aries-Prima Memory Test probe card. The probe card is designed specifically to meet the current high ...

EIGHTY-FOUR, PA.—Long ago, storage components were principally ranked by the individual physical capacity of the device, or in the case of JBODs (just a bunch of disks), the array. As technologies ...

May 15, 2012. Advantest Corp. has announced the availability of its next-generation high-speed DRAM test system, the T5511. Advantest says the new system, which begins shipping this month, offers the ...