We hope and believe that the analysis, techniques, and results we present in this dissertation will enable the community to better understand and tackle current and future reliability challenges as ...
Memory test at-speed isn't easy but can be achieved by balancing test selection, area overhead, and test-time constraints. The semiconductor industry has intensified its focus on yield issues to meet ...
Achieving functional safety levels mandated by the ISO 26262 standard requires periodic testing of a vehicle’s electronics. This testing can be applied at three distinct time periods, each with its ...
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