Simple mechanical changes can significantly improve probe card performance. Epoxy-ring probe cards with 2,000 or more probes are economical solutions to multi-DUT parallel test. The key to repeatable ...
FormFactor has announced the latest addition to its TrueScale probe-card family for wire-bond system-on-chip (SOC) devices. Offering scalability down to a 40-micron pad pitch, the TrueScale PP40 wafer ...
FormFactor has introduced the PH150XP wafer probe card, an extension of the company's PH150 product family for DRAM wafer testing. The PH150XP offers several yield and throughput enhancements to ...
LIVERMORE, Calif., May 29, 2020 (GLOBE NEWSWIRE) -- FormFactor, Inc. (NASDAQ:FORM), a leading semiconductor test and measurement supplier, today announced the release of the SmartMatrix 3000XP probe ...
Every wafer test touch-down requires a balance between a good electrical contact and preventing damage to the wafer and probe card. Done wrong, it can ruin a wafer and the customized probe card and ...
Chunghwa Precision Test Tech (CHPT), an IC test interface solutions provider, is optimistic about demand spurred by AI servers and smartphones and projects a surge in probe card orders in the second ...
As a partner for the semiconductor equipment industry, as well as test providers and users, Jenoptik is offering a novel optical solution for integration into electrical test cards. The ultra-fast ...
STAr Technologies, a leading test system and probe card supplier to semiconductor industry, today announced the opening of a new probe card demo and potential test services center in the key ...
Simple mechanical changes can significantly improve probe card performance. Epoxy-ring probe cards with 2,000 or more probes are economical solutions to multi-DUT parallel test. The key to repeatable ...
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