EDN

Center probe RF test socket is designed for Delta handlers

Frenchtown, N.J. — Aries Electronics has introduced a new center probe RF test socket designed specifically for use with Delta handlers. The new test sockets incorporate built-in, replaceable, ...
Semiconductor Engineering

Enhancing Test Socket Performance Through Application-Specific Validation And System-Level Per-Pin OQC

As semiconductor devices continue to advance, the demand for reliable, high-performance test sockets has never been greater. Yet, traditional socket design validation methods—such as per-pin ...
EDN

New Kelvin Test Socket from Aries Ideal for Low Resistance Testing of Devices with Lead Pitch down to 0.4 mm

Bristol, Pa. January 2010 – Aries Electronics, an international manufacturer of standard, programmed and custom interconnection products, now offers a new Kelvin test socket that handles devices with ...
Morningstar

Modus Test Partners with yieldWerx to Deliver Closed-Loop Socket to Silicon Correlation

RICHARDSON, Texas, Feb. 26, 2026 /PRNewswire/ -- Modus Test, a leader in advanced test socket testing solutions and performance validation, and yieldWerx, a semiconductor data and yield analytics ...
Digi Times

Smiths Interconnect's DaVinci 112 high-speed test socket wins best test measurement award at the 2024 Global Electronics Achievement Awards

Smiths Interconnect is thrilled to announce that its DaVinci 112 high-speed test socket received the prestigious Best Test Measurement Award of the Year at the Global Electronics Achievement Awards ...
Electronics Weekly

Test socket with less cross-talk for 350μm pitch ICs

Smiths Interconnect has created an IC test socket for high-speed testing of 350μm minimum pitch devices. Smiths Interconnect has created an IC test socket for high-speed testing of 350μm minimum pitch ...
Electronic Design

Packaging/Interconnects: Test Socket With RF Center Probe Eliminates Package-Lead Damage

A high-frequency center-probe test socket features a floating guide plate with a built-in hand stop to protect probes during test and eliminate damage to the package leads. Well suited for automated ...
Digi Times

GTC 2025: WinWay to present new test socket solutions for AI

The five-day Nvidia GPU Technology Conference (GTC) officially kicked off on March 17 US time, focusing on innovative applications such as robotics and generative AI (GenAI). As a test interface ...
Electronic Design

Test & Measurement: Socket Tester Runs Interconnect Tests On 200-Pin DIMMs

Designers encounter many obstacles when using boundary-scan techniques to test sockets. The ScanDIMM-S0200 intelligent socket tester overcomes those problems, performing advanced interconnect tests on ...
Semiconductor Engineering

Maximize Your Revenue With High-Speed Test Performance Optimization

In today’s competitive semiconductor market, revenue growth is often associated with design innovation, process advancements, ...
Electronics Weekly

Socket for Array Area and Peripheral Package Test

Smiths Interconnect has brought out its Galileo test socket for Area Array and Peripheral Package Test. Galileo is a test socket engineered to support today’s high performance Digital and RF ...