Combine AI-generated tests with intelligent test selection to manage large regression suites and speed up feedback ...

A newly drafted IEEE standard will bring more consistency to defect metrics in analog/mixed (AMS) designs, a long-overdue step that has become too difficult to ignore in the costly heterogeneous ...

It happens when metrics suggest that a system is well tested, but important behaviours, risks, or failure scenarios remain ...

When it comes to semiconductor device testing, the primary goal is to ensure that each device meets functional and performance specifications. Testing also plays a crucial role in confirming that ...

System-level test (SLT), once used largely as a stopgap measure to catch issues missed by automated test equipment (ATE), has evolved into a necessary test insertion for high-performance processors, ...

When developers and engineers measure code coverage in embedded systems they can improve their device’s safety and performance. Embedded systems play a foundational ...