Researchers have systematically charted a superconducting dome in thin films of strontium-doped lanthanum nickelate, ...

Researchers have demonstrated a new technique for precisely controlling phase boundaries in thin film materials by manipulating the thickness of those films – allowing them to engineer energy storage ...

Dendritic structures that emerge during the growth of thin films are a major obstacle in large-area fabrication, a key step towards commercialization. However, current methods of studying dendrites ...

Ellipsometry is a non-destructive, optical measurement technique that characterizes the optical properties of thin films. It is highly sensitive to changes in the thickness and refractive index of the ...

The major factors affecting the performance of crystalline thin films are the presence of grain boundaries and inherent crystal structure. Post-deposition annealing is frequently employed to improve ...