PCA and K-means clustering applied to Raman and PL imaging reveal structural defects in silicon wafers, enhancing understanding of optoelectronic performance.
Abstract: Reliability analysis for structural systems relies on an accurate surrogate model. Currently, several multiple Kriging methods are utilized to calculate the failure probability. However, ...
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Celtic FC’s latest run of form tells a story of ambition, attacking firepower, and areas that still need tightening. The Hoops remain firmly in the mix domestically while juggling the added demands of ...
Abstract: This paper presents a novel method for power system reliability studies that combines graph neural networks with reinforcement learning. Monte Carlo methods are the backbone of probabilistic ...
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